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Gen3, a global leader in solderability, cleanliness, and process optimization test equipment, has been awarded ‘Partner of the Year’ by MEK Europe BV. Gen3 was the company’s best performing supply chain partner for 2021.
The recipient of MEK’s Partner of the Year award is determined by industry performance in multiple capacities, including sales figures, effectiveness in selling new products, and growth in the number of new customers year-on-year. Gen3 was the overall best performer in all areas.
“We would like to congratulate Gen3 for their pioneering efforts & resourcefulness to create so many opportunities in the UK market,” said Jeremey Saise, Technical Director of MEK Europe. “This has placed us in a very strong position for 2022.”
CEO Andy Naisbitt, pictured right with MEK’s Jeremy Saise, commented on acceptance of this award, “Gen3 are proud to receive this award from our long-standing partners, MEK. We are delighted that even with the difficult period through COVID, the Gen3 team were able to improve our sales and support our customer’s needs. Thanks to our Jack McCaigue and Graham Dickson for driving the improvement.”
Gen3 and MEK have been working together since 2008. Recently, Gen3 has seen strong demand for the MEK VeriSpector AOI assembly station for use on manual and semi-automated SMD and THT assembly stations. With extremely short inspection times (< 5 sec), the VeriSpector AOI system allows manufacturers to perform real time assembly and placement inspection, carry out repairs on-the-fly and prevent defects before they move into the next process. Over the years of working together Gen3 has also seen a high demand for MEK’s Powerspector GTAz 520 CE, an in-line 3D automatic optical inspection system. This system produces revolutionary 3D imaging using 9 cameras. Full colour 3D allows the ability to see the side of components rather than extruded 2D images.
For more information about Gen3 Systems, visit www.gen3systems.com.
Additional content from GEN3:
- The Printed Circuit Assembler’s Guide to… Process Validation by Graham K. Naisbitt
- “Predicting Reliability in Electronics,” a free 12-part webinar series with experts Graham Naisbitt and Chris Hunt
- Roundtable Discussion: Process Ionic Contamination Test (PCT) Standard Roundtable with Industry Experts, including Graham Naisbitt of GEN3, Teresa Rowe of IPC, Jason Keeping of Celestica, and Doug Pauls of Collins Aerospace
- You can also view other titles in our full I-007eBooks library here